We just released an update to RF Path Analysis Toolkit (Version 1.4). The release contains some nice time saving features and improvements:

• Drag and Drop RF Components: In the RF Path Builder display, you can now drag and drop RF components in the path table rows. This makes it easy to move RF components around in the RF path. Previously if you wanted to move an RF component, you had to delete the RF component, and then look it up again in the library to insert it into a new location.
• Sub paths: You can now define an RF Path as a series of sub paths, which are individual RF path files. This saves potential errors and time in updating many RF paths containing the same path information. Previously, you could only manually load sub paths into an RF path file. Now they can be defined within the RF path file itself.
• Export to Excel options: Now you can select the option to leave the detailed RF path analysis spreadsheet open after "Export to Excel" is selected. Previously the detailed RF path analysis spreadsheet was closed after "Export to Excel". This is convenient for viewing the detailed results quickly as you are building RF paths.
• More information in the RF Path Builder display: As you are building an RF path in the RF Path Builder, you can now see the following parameters:
• Device Nominal Gain
• Cumulative Gain to Device Output
• Device Noise Figure
• Cumulative Noise Figure to Device Output
• Signal 1 Power at Device Output
• Signal 2 Power at Device Output
• Device Third Order Output Intercept Point
• Cumulative Third Order Input Intercept Point
• Device 1 dB Output Compression Point
• Signal 2 Delta from Device 1 dB Compression Point
• Third Order Spurs at Device Output (new!)
• Cumulative 1 dB Input Compression Point (new!)
These new parameters are helpful when designing RF paths with difficult dynamic range requirements, and provide more insight into dynamic range contributors as you are building the RF path.
• Path File Save and Load folders: You can now specify the default directory for saving and loading RF path files. Previously this was fixed to the "Level 1" directory.
• Revised template spreadsheets: We've updated and improved the template detailed analysis spreadsheets. There are now two template spreadsheets:
• RFPATTemplate4-2.xls is a simplified (but still very useful) RF path analysis spreadsheets for receivers and transmitters. Antenna gains can not be accurately incorporated into the model. Sensitivity calculations are based on the receiver RF components only.
• RFPATTemplate6-2.xls is a more advanced RF path analysis spreadsheet. This template allows for separate RF component "signal gain" and "noise gain" parameters. This allows the spreadsheet to show radiated sensitivity, because antenna gains can be taken into account (antennas have "signal gain" but no "noise gain"). Basic RF components have the same "signal gain" and "noise gain".
• File Path dialog boxes should be more descriptive and helpful.
• Other changes to the user interface/display to help clarify the operation of the program.

Hello Fellow Test Engineers and Managers:

• Are you frustrated with the time and effort required to test your RF and microwave components?
• Are you upset with the errors and mistakes associated with manual testing?
• Is developing your own computer automated test software beyond your budget?

• Do you already have test equipment capable of GPIB control?
• 1, 2, or 3 RF Signal Generators?
• A Spectrum Analyzer?
• An RF Power Meter?
• Wouldn't it be great if there was a software program already developed that could be used right away to start making automated RF measurements?

We have a software program, called RFSpecTest, which has many built-in computer automated RF/microwave tests already developed. We've just created a demonstration version that can be downloaded and evaluated. More information is available from our software information page. Download the demo, and try out the tests and interfaces available. We also have some sample measurement files you can load into the program. Give it a try and let us know what you think!

Apple TV, iPhone... How many more technological marvels can we take this week?

We decided to add our own surprise to a big technology week with the release of Painless Extraction 2.0!

Painless Extraction 2.0 adds some great new features to the previous version:

• Capability to extract 1-4 channels of measurements from HP (Agilent) 8757 Series Scalar Analyzers,
• A new script creation page that allows the user to set up test scripts, which compare the measurements against user-defined test limits, and a test summary report is created.

8757 Series Scalar Analyzers:

Painless Extraction 2.0 has been designed to extract up to 4 channel measurements from HP 8757 series scalar analyzers. The extracted data is stored into the magnitude arrays of the S2P files (Phase arrays are zeroed out). Up to 4 channels can be extracted from the scalar analyzers. The 4 channels could be S-parameters (S11, S21), or they could be any channel setup from the scalar analyzer (A/R, B/R, C/R, A/B, etc.) Whatever the user sets up on the scalar analyzer channels, Painless Extraction retrieves the data from the analyzer, analyzes it, and stores it in "S2P format" files for future retrieval and data analysis.

Now the same capability we've provided for network analyzers (HP 8720 Series, HP 8510 Series, HP 8753 Series) is available for HP 8757 Series scalar analyzers. (Please note that we have verified the program specifically with a 4-Channel HP 8757C scalar analyzer.)

Statistical Analysis and Test Scripts:

We've added a new "tab" which can be used to perform statistical analysis on the various measurement channels. For example, let's say you have the network or scalar analyzer set up to take S11 (return loss) and S21 (gain) measurements over the frequency band of 1.0 to 3.0 GHz. You can very quickly set up a test script which sets the Pass/Fail limits for the S21/gain measurements, and sets up the Pass/Fail limits for the S11/return loss measurements. Now when you connect the amplifier, and the measurements on the analyzer are set up, you can retrieve the measurements from the analyzer and compare the measurements with the test limits and make Pass/Fail determinations. You can then save the test summary report in a tab-separated text format, which can be imported into spreadsheet programs (Excel and others).

This is a great feature if you are using a network analyzer or scalar analyzer for high volume production testing!

More information is available from our software products page, and the associated links for downloading a demo version of this program.

Thanks to Amelia for her great support in updating this program.
Bob Wood

Hello Everybody

We just wanted to give you a quick "heads up" about the upcoming version 2.0 of Painless Extraction. We have added some pretty significant features, such as:

• The capability to retrieve S-Parameters or other Channels 1-4 measurements from HP8757C Scalar Analyzers. We believe this will open up a whole new market for this program.
• The capability to create a quick test script that will allow the user to set various test parameters for the retrieved data, such as average gain, minimum gain, maximum gain, P-P flatness, RMS, standard deviation, best fit line slope, and many others. The measured data from the network or scalar analyzer is then compared against these test parameters, and Pass/Fail results are reported. This is a great feature for production testing, or testing multiple parts with the same test parameters.

We expect to have this version released within the next 2 weeks. Please stop by again, try it out, and let us know what you think about the new version.

Thanks!

Bob Wood

On September 15 2006, R. A. Wood Associates delivered the first two of 15 complete Integrated RF Test Racks. The Integrated RF Test Rack provided a complete solution for complete automated testing of 7 RF/Digital modules. All equipment was controlled through GPIB interfaces. All automated test software was written in National Instruments LabVIEW by R. A. Wood Associates. RFSpecTest was used in "script" mode to perform most of the RF measurements. The rack consisted of:

• 2 Signal Generators (one for RF signals, one for LO signals)
• 1 Spectrum Analyzer (for measuring RF signal amplitudes and frequencies)
• 1 Multimeter (for monitoring resistances and voltages at various points on the modules)
• 3 Power Supplies (for providing DC power to the modules under test)
• A rack mount PC with GPIB and Digital I/O cards, loaded with software for controlling test equipment and reporting test results
• A rack mount interruptible power supply (UPS)
• R. A. Wood Associates Automated RF Test Fixture
• Laser Bar Code Reader (for reading and automatic entry of module serial numbers)
• A 19" Flat Panel Display (mounted on movable monitor arm)
• Keyboard and Mouse in a slide-out ergonomic tray

The full rack was designed to be a comfortable testing environment, as well as easy to maintain. Equipment is easy to remove if needed with minimal interference to other equipment.

More information about the Integrated RF Test Rack is available from this link.

R. A. Wood Associates introduced their latest computer automated RF test software suite, RFSpecTest, at National Instruments (NI) Week, August 13-16. See Press release. The test software suite is centered around NI's latest RF product, the NI 5660 Spectrum Analyzer. Automated testing for gain, two tone intermodulation products, gain compression, relative measurements, and others was demonstrated for amplifiers, mixers, switches, filters, attenuators, RF integrated circuits and more. Thanks to all who stopped by to see our new product! A picture of our booth and computer automated test setup at NI Week. For an overview of the of RFSpecTest, select this link (1.7 MB pdf file).

Two Tone Third Order Output Intercept Point Measurements

This LabVIEW panel shows the results of computer automated Two-Tone Third Order Output Intercept Point measurements for a PCS band RF amplifier. Measurements were performed using two programmable signal generators and a spectrum analyzer. A power meter was used to calibrate the input and output cables and connectors, and the spectrum analyzer amplitude readings. This panel design is tailored toward an "engineering evaluation" environment, instead of a "production test" environment.

1 dB Output Gain Compression Point Measurements

This LabVIEW panel shows the results of a computer automated 1 dB Output Gain Compression Point measurements for a PCS band RF amplifier. Measurements were performed using a programmable signal generator and a spectrum analyzer. A power meter was used to calibrate the input and output cables and connectors, and the spectrum analyzer amplitude readings. This panel design is tailored toward an "engineering evaluation" environment, instead of a "production test" environment. This is just one example of the types of automated RF measurements that can be performed using LabVIEW.

LabVIEW Example - Computer Automated Noise Figure Measurements

This LabVIEW panel shows the results of computer automated Noise Figure measurements for a PCS band RF amplifier. Measurements were performed using a HP-8970B Noise Figure Meter. This panel design is tailored toward an "engineering evaluation" environment, compared to a "production test" environment. This is just one example of the types of automated RF measurements that can be performed using LabVIEW.

Software Controlled Laser Power Meter Interface

• Software was developed to provide a computer-controlled interface to a Universal Radiometer. The Universal Radiometer is a piece of test equipment used to measure laser power. The device was controlled by a PC serial port. The software was developed using National Instruments LabVIEW graphical programming language.
• All instrument controls are sent from the screen display through the PC serial port to the test equipment.
• Data from the test equipment is sent via the PC serial port to the computer and analyzed and displayed on the screen display.
• Measured data can be stored to an external file in Microsoft Excel or other spreadsheet compatible format.
• Measurement statistics are calculated and displayed in real time

LabVIEW Example - Spectrum Analyzer Instrument Driver

This LabVIEW panel shows an software controlled instrument driver that is utilized for HP Spectrum Analyzers. The software has been used on HP-8566B and HP-8593E Series Spectrum Analyzers. All front panel controls are translated to GPIB commands to control the equipment over a GPIB interface. The output readings are Marker Frequency and Marker Amplitude. Various options are included for locating and finding RF signals.

Tuning Station Example (Audible Feedback)

In this example an amplifier tuning station provides audible feedback to aid the technician in tuning the amplifier within its specified performance limits. The technician can tune the amplifier under a microscope, using the audio tones to indicate how close the device meets its specified performance window. The technician does not have to look up from his work to check an instrument panel to determine the results of his/her tuning.

R. A. Wood Associates can custom develop automated test software for your particular needs in your test station. We can provide and implement ideas to enhance your productivity.